home    about    browse    search    latest    help 
Login | Create Account

Screening of micro-organisms for Venturia inaequalis control by means of DGGE

Speksnijder, Arjen; Lombaers- van der Plas, Carin and Köhl, Jürgen (2006) Screening of micro-organisms for Venturia inaequalis control by means of DGGE. Paper at: Joint Organic Congress, Odense, Denmark, May 30-31, 2006.

[thumbnail of ArjenJOC.pdf] PDF - English
131kB


Summary in the original language of the document

Venturia inaequalis causes apple scab. The control of the disease in organic apple production depends on the use of copper which will be restricted in future for environmental reasons.
In the search for environmental friendly microbial biocontrol agents and stimulation of antagonistic populations in situ the molecular technique of DGGE fingerprinting can is applied. This fingerprinting technique allows to bypass culturing techniques and even can identify not yet culturable organisms.
Comparison of microbial fingerprints and pathogen development in the leaf samples during winter and spring has been performed to identify populations with antagonistic potential. Such potential antagonistic organisms can be further identified by their specific DNA sequence. Preliminary results identify possible antagonists. The identification based on the sequence can help to focus on specific isolation or stimulation of a possible antagonist or a consortium of antagonists.


EPrint Type:Conference paper, poster, etc.
Type of presentation:Paper
Subjects: Crop husbandry > Crop health, quality, protection
Research affiliation: International Conferences > 2006: Joint Organic Congress > Theme 5: Protecting plant health
Netherlands > Wageningen University & Research (WUR) > Plant Research International PRI
Deposited By: Speksnijder, Dr Arjen
ID Code:7431
Deposited On:10 May 2006
Last Modified:12 Apr 2010 07:32
Document Language:English
Status:Published
Refereed:Not peer-reviewed

Repository Staff Only: item control page

Downloads

Downloads per month over past year

View more statistics